Special Articles: Automated Inspection Technology for Packaging. Inspection Technology for Semi-Conductor Components by CCD Camera.

Wafer Inspection Technology Challenges for ULSI Manufacturing

The use of wafer inspection systems in managing semiconductor manufacturing yields is described. These systems now detect defects of size as small as 40 nm. Some high-speed systems have achieved 200-mm diameter wafer throughputs of 150 wafers per hour. The particular technologies involved are presented. Extensions of these technologies to meet the requirements of manufacturing integrated circui...

Technology for Robotic Surface Inspection in Space

This paper presents on-going research in robotic inspection of space platforms. Three main areas of investigation are discussed: machine-vision inspection techniques, an integrated sensor end-e ector, and an orbital environment laboratory simulation. Machine-vision inspection utilizes automatic comparison of new and reference images to detect on-orbit induced damage such as micro-meteorite impa...

Automation Technology for Fabric Inspection System

Automated Inspection using Database Technology within the Aerospace Industry

Many manufacturing processes have become fully automated resulting in high production volumes. However, this is not the case for inspection. Shortening the inspection times in manufacturing industry using the available information resources can result in the reduction of production lead-time and overall costs. Rapid advances in machine tool technology have resulted in fast processing Computer N...

Camera and light placement for automated assembly inspection

| Visual assembly inspection can provide a low cost, accurate, and e cient solution to the automated assembly inspection problem, which is a crucial component of any automated assembly manufacturing process. The performance of such an inspection system is heavily dependent on the placement of the camera and light source(s). This article presents new algorithms that use the CAD model of a nished...